1. SCANNING TUNNELING MICROSCOPE (STM) measures a weak electrical current flowing between tip and sample as they are held a very small distance apart. The STM provides images of conductive surfaces on the atomic scale also can be used to manipulate individual atoms.
2. ATOMIC FORCE MICROSCOPE (AFM) measures the interaction force between the tip and sample surface. The tip may be dragged across the surface, or may vibrate as it moves.
3. NEAR-FIELD SCANNING OPTICAL MICROSCOPE (NSOM) scans a tiny light source very close to the sample.
LINK TO STM IMAGE GALLERY, IBM Almaden Research Center
Scientific instruments have opened up sensory domains far beyond the constraints of biological perception. Technology has extended our phenotype enormously and has pushed the boundaries of what can be known...
Scanning Tunneling Microscope (STM). Source: SPeCS
Tin atoms on a silicon surface showing various defects: Thorbjörn Jemander et al. Semiconductor Physics, Linköpings universitet, Sweden.
Etched tungsten STM tip: Mirecki-Millunchick group, The University of Michigan.
